Open AccessApplication of storage life prediction model based on performance degradation distribution in fuze storage life prediction
Author(s) -
Hongyan Wang,
Xinglin Qi,
Yingwei Wu
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5005189
Subject(s) - fuze , weibull distribution , reliability engineering , reliability (semiconductor) , accelerated life testing , degradation (telecommunications) , engineering , computer science , statistics , mathematics , electrical engineering , power (physics) , materials science , physics , quantum mechanics , metallurgy
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