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Nanomechanical probing of thin-film dielectric elastomer transducers
Author(s) -
Bekim Osmani,
Saman Seifi,
Harold S. Park,
Vanessa Leung,
Tino Töpper,
Bert Müller
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5000736
Subject(s) - materials science , elastomer , composite material , dielectric , indentation , nanoindentation , dielectric elastomers , soft robotics , electrode , electric field , actuator , nanotechnology , optoelectronics , electrical engineering , chemistry , physics , quantum mechanics , engineering
Dielectric elastomer transducers (DETs) have attracted interest as generators, actuators, sensors, and even as self-sensing actuators for applications in medicine, soft robotics, and microfluidics. Their performance crucially depends on the elastic properties of the electrode-elastomer sandwich structure. The compressive displacement of a single-layer DET can be easily measured using atomic force microscopy (AFM) in the contact mode. While polymers used as dielectric elastomers are known to exhibit significant mechanical stiffening for large strains, their mechanical properties when subjected to voltages are not well understood. To examine this effect, we measured the depths of 400 nanoindentations as a function of the applied electric field using a spherical AFM probe with a radius of (522 ± 4) nm. Employing a field as low as 20 V/μm, the indentation depths increased by 42% at a load of 100 nN with respect to the field-free condition, implying an electromechanically driven elastic softening of the DET. T...

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