SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation
Author(s) -
Karl Meiners-Hagen,
Tobias Meyer,
Jutta Mildner,
Florian Pollinger
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5000569
Subject(s) - optics , interferometry , wavelength , white light interferometry , standard deviation , millimeter , coherence length , laser , physics , refractive index , materials science , statistics , superconductivity , mathematics , quantum mechanics
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