Characterization of thin film displacements in the electron microscope | Zendy

Hidetaka Sawada | Zendy; R. Ramlau | Zendy; Christopher S. Allen | Zendy; Angus I. Kirkland | Zendy

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Characterization of thin film displacements in the electron microscope

Author(s) -

Hidetaka Sawada,

R. Ramlau,

Christopher S. Allen,

Angus I. Kirkland

Publication year - 2017

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4999003

Subject(s) - tilt (camera) , perpendicular , materials science , optics , elongation , dark field microscopy , thin film , electron microscope , film plane , displacement (psychology) , plane (geometry) , resolution (logic) , characterization (materials science) , condensed matter physics , magnetic field , microscopy , physics , magnetic anisotropy , nanotechnology , geometry , composite material , psychology , mathematics , magnetization , quantum mechanics , artificial intelligence , computer science , psychotherapist , ultimate tensile strength

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