A 5-μm pitch charge-coupled device optimized for resonant inelastic soft X-ray scattering
Author(s) -
Nord Andresen,
P. Denes,
A. Goldschmidt,
John Joseph,
A. Karcher,
C. Tindall
Publication year - 2017
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4997727
Subject(s) - beamline , physics , optics , spectrometer , scattering , dot pitch , silicon , charge coupled device , responsivity , electron , pixel , detector , materials science , optoelectronics , beam (structure) , nuclear physics
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