Open AccessElectromigration and the structure of metallic nanocontacts
Author(s) -
R. Hoffmann
Publication year - 2017
Publication title -
applied physics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.084
H-Index - 66
ISSN - 1931-9401
DOI - 10.1063/1.4994691
Subject(s) - electromigration , materials science , characterization (materials science) , fabrication , quantum tunnelling , nanotechnology , recrystallization (geology) , grain boundary , current density , condensed matter physics , optoelectronics , microstructure , composite material , medicine , paleontology , alternative medicine , physics , pathology , quantum mechanics , biology
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