Open AccessNovel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device
Author(s) -
A. J. Creely,
K. Ida,
M. Yoshinuma,
T. Tokuzawa,
T. Tsujimura,
T. Akiyama,
R. Sakamoto,
M. Emoto,
K. Tanaka,
C. Michael
Publication year - 2017
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4993437
Subject(s) - reflectometry , large helical device , plasma diagnostics , optics , plasma , radius , materials science , physics , computational physics , time domain , computer security , quantum mechanics , computer science , computer vision
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