Electronic structure, excitation properties, and chemical transformations of extreme ultra-violet resist materials
Author(s) -
Sylvie Rangan,
R. A. Bartynski,
Amrit Narasimhan,
Robert L. Brainard
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4992083
Subject(s) - resist , x ray photoelectron spectroscopy , irradiation , polymer , electronic structure , materials science , electron energy loss spectroscopy , reactivity (psychology) , chemical physics , spectroscopy , photoemission spectroscopy , chemistry , photochemistry , nanotechnology , chemical engineering , computational chemistry , transmission electron microscopy , physics , composite material , medicine , alternative medicine , layer (electronics) , pathology , quantum mechanics , nuclear physics , engineering
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