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Atomic-scale epitaxial aluminum film on GaAs substrate
Author(s) -
Yen-Ting Fan,
Ming-Cheng Lo,
Chu-Chun Wu,
Peng-Yu Chen,
Jenq-Shinn Wu,
Chi-Te Liang,
Sheng-Di Lin
Publication year - 2017
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4991435
Subject(s) - fabrication , materials science , aluminium , thin film , substrate (aquarium) , epitaxy , nanotechnology , atomic layer deposition , metal , layer (electronics) , atomic units , electrical resistivity and conductivity , nanolithography , superconductivity , optoelectronics , metallurgy , condensed matter physics , physics , oceanography , quantum mechanics , geology , medicine , alternative medicine , pathology
Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals

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