Experimental characterization of true spontaneous emission rate of optically-pumped InGaAs/GaAs quantum-well laser structure
Author(s) -
Qianmiao Yu,
Yan Jia,
W. Lu,
Mengkang Wang,
Fangkun Li,
J. Zhang,
X. Zhang,
Y Q Ning,
Wu Jian
Publication year - 2017
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4990630
Subject(s) - photoluminescence , laser , spontaneous emission , quantum well , materials science , optoelectronics , indium , emission spectrum , spectral line , amplified spontaneous emission , indium gallium arsenide , semiconductor laser theory , characterization (materials science) , gallium arsenide , quantum , indium phosphide , enhanced data rates for gsm evolution , optics , physics , semiconductor , nanotechnology , quantum mechanics , telecommunications , computer science
In this paper, an experimental approach to acquiring true spontaneous emission rate of optically-pumped InGaAs/GaAs quantum-well laser structure is described. This method is based on a single edge-emitting laser chip with simple sample processing. The photoluminescence spectra are measured at both facets of the edge-emitting device and transformed to the spontaneous emission rate following the theory described here. The unusual double peaks appearing in the spontaneous emission rate spectra are observed for the InGaAs/GaAs quantum-well structure. The result is analyzed in terms of Indium-rich island and Model-Solid theories. The proposed method is suitable for electrically-pumped quantum-well laser structures, as well
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