Open AccessPlasmonic properties of implanted Ag nanoparticles in SiO2 thin layer by spectroscopic ellipsometry
Author(s) -
Yann Battie,
Aotmane En Naciri,
N. Chaoui,
Yann Le Gall,
D. Müller,
M. Carrada,
D. Mathiot
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4989793
Subject(s) - ellipsometry , plasmon , materials science , transmission electron microscopy , volume fraction , nanoparticle , dielectric , surface plasmon resonance , ion , analytical chemistry (journal) , ion implantation , thin film , optoelectronics , nanotechnology , chemistry , composite material , organic chemistry , chromatography
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