Stress dependence of the suspended graphene work function: Vacuum Kelvin probe force microscopy and density functional theory
Author(s) -
Alexander Volodin,
Chris Van Haesendonck,
O. Leenaerts,
B. Partoens,
F. M. Peeters
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4982931
Subject(s) - graphene , kelvin probe force microscope , materials science , work function , work (physics) , density functional theory , graphene nanoribbons , silicon , oxide , microscopy , condensed matter physics , nanotechnology , molecular physics , chemical physics , atomic force microscopy , chemistry , optoelectronics , optics , thermodynamics , computational chemistry , physics , layer (electronics) , metallurgy
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