Open AccessAccident rate of a plant equipped with an aging single-channel trip device with non-exponential demand and repair times
Author(s) -
P.F. Frutuoso e Melo,
D. G. Teixeira,
A.C.M. Alvim
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4982023
Subject(s) - channel (broadcasting) , reliability engineering , computer science , failure rate , exponential function , exponential distribution , on demand , forensic engineering , engineering , telecommunications , mathematics , statistics , multimedia , mathematical analysis
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