Open AccessX-ray line profile analysis of BaTiO3 thin film prepared by sol-gel deposition
Author(s) -
Zeen Vee Ooi,
Ala’eddin A. Saif,
Yufridin Wahab,
Zul Azhar Zahid Jamal
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4981833
Subject(s) - crystallite , scherrer equation , diffractometer , materials science , lattice constant , thin film , x ray crystallography , crystallinity , lattice (music) , analytical chemistry (journal) , crystallography , condensed matter physics , diffraction , optics , composite material , nanotechnology , physics , scanning electron microscope , chemistry , chromatography , acoustics , metallurgy
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