Ptychographic microscopy via wavelength scanning | Zendy

Yeran Bai | Zendy; Suhas.P. Vettil | Zendy; Xingchen Pan | Zendy; Cheng Liu | Zendy; Jianqiang Zhu | Zendy

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Ptychographic microscopy via wavelength scanning

Author(s) -

Yeran Bai,

Suhas.P. Vettil,

Xingchen Pan,

Cheng Liu,

Jianqiang Zhu

Publication year - 2017

Publication title -

apl photonics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 2.094

H-Index - 34

ISSN - 2378-0967

DOI - 10.1063/1.4979512

Subject(s) - ptychography , optics , wavelength , data acquisition , laser scanning , laser , sample (material) , microscopy , materials science , field of view , computer science , remote sensing , physics , diffraction , geology , thermodynamics , operating system

A wavelength scanning Ptychographic Iterative Engine (ws-PIE) is proposed to reconstruct high-quality complex images of specimens. Compared with common ptychography, which required the user to transversely scan the sample during data acquisition, the ws-PIE fundamentally reduces the data acquisition time and can avoid the heavy dependence on the accuracy of the scanning mechanism. This method can be easily implemented in the field of material and biological science as the wavelength-swept laser source is currently commercially available. The feasibility of the ws-PIE is demonstrated numerically and experimentally

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