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Morphology of ion irradiation induced nano-porous structures in Ge and Si1−xGex alloys
Author(s) -
Huda Alkhaldi,
Felipe Kremer,
Pablo MotaSantiago,
A. Nadzri,
D. Schauries,
Nigel Kirby,
M. C. Ridgway,
P. Kluth
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4978592
Subject(s) - fluence , materials science , ion , scanning electron microscope , transmission electron microscopy , irradiation , radius , porosity , scattering , ion implantation , analytical chemistry (journal) , germanium , ionic radius , crystallography , nanotechnology , silicon , composite material , chemistry , optics , optoelectronics , physics , computer security , organic chemistry , chromatography , computer science , nuclear physics

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