Direct measurement and microscale mapping of nanoNewton to milliNewton magnetic forces | Zendy

Camilo Vélez | Zendy; Robin E. Carroll | Zendy; David P. Arnold | Zendy

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Direct measurement and microscale mapping of nanoNewton to milliNewton magnetic forces

Author(s) -

Camilo Vélez,

Robin E. Carroll,

David P. Arnold

Publication year - 2017

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4978316

Subject(s) - microscale chemistry , metrology , magnetic field , magnet , microfluidics , microelectromechanical systems , image resolution , materials science , actuator , dimensional metrology , optics , physics , nanotechnology , mechanical engineering , electrical engineering , engineering , mathematics education , mathematics , quantum mechanics

This paper describes the direct measurement and mapping of magnetic forces/fields with microscale spatial resolution by combining a commercial microforce sensing probe with a thin-film permanent micromagnet. The main motivation of this work is to fill a critical metrology gap with a technology for direct measurement of magnetic forces from nN to 10’s of mN with sub-millimeter spatial resolution. This capability is ideal for measuring forces (which are linked to magnetic field gradients) produced by small-scale magnetic and electromagnetic devices including sensors, actuators, MEMS, micromotors, microfluidics, biomedical devices. This new measuring technique is validated by comparison of measured forces from small permanent magnets with the analytical models

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