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Tunneling magnetoresistance sensors with different coupled free layers
Author(s) -
Yen-Fu Liu,
Xiaolu Yin,
Yi Yang,
Dan Ewing,
Paul J. De Rego,
S. H. Liou
Publication year - 2017
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4977774
Subject(s) - ferrimagnetism , magnetoresistance , condensed matter physics , quantum tunnelling , annealing (glass) , materials science , coercivity , magnetic field , magnetization , giant magnetoresistance , tunnel magnetoresistance , nanostructure , inductive coupling , ferromagnetism , nanotechnology , physics , metallurgy , quantum mechanics
Large differences of magnetic coercivity (HC), exchange coupling field (HE), and tunneling magnetoresistance ratio (TMR) in magnetic tunnel junctions with different coupled free layers are discussed. We demonstrate that the magnetization behavior of the free layer is not only dominated by the interfacial barrier layer but also affected largely by the magnetic or non-magnetic coupled free layers. All these parameters are sensitively controlled by the magnetic nanostructure, which can be tuned also by the magnetic annealing process. The optimized sensors exhibit a large field sensitivity of up to 261%/mT in the region of the reversal synthetic ferrimagnet at the pinned layers

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