Open AccessStudy on the system-level test method of digital metering in smart substation
Author(s) -
Xiang Zhang,
Min Yang,
Juan Hu,
Fuchao Li,
Ruixi Luo,
Jinsong Li,
Bing Ai
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4977337
Subject(s) - metering mode , economic shortage , reliability (semiconductor) , computer science , test (biology) , reliability engineering , embedded system , engineering , mechanical engineering , paleontology , linguistics , philosophy , power (physics) , physics , quantum mechanics , government (linguistics) , biology
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