Characterization of ZnO films prepared by sol-gel method
Author(s) -
Jide Zhang,
Xin Sun,
Tong Qi,
Ge Ren,
Yingyu Shan,
Qingya Dong
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4977250
Subject(s) - materials science , annealing (glass) , band gap , diffraction , grain size , thin film , absorption edge , sol gel , enhanced data rates for gsm evolution , atomic force microscopy , substrate (aquarium) , absorption spectroscopy , analytical chemistry (journal) , optoelectronics , composite material , optics , nanotechnology , computer science , telecommunications , oceanography , physics , chemistry , chromatography , geology
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