Accuracy analysis of structure with nearby interfaces within XFEM | Zendy

Nana Duan | Zendy; Weijie Xu | Zendy; Shuhong Wang | Zendy; Jianguo Zhu | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Accuracy analysis of structure with nearby interfaces within XFEM

Author(s) -

Nana Duan,

Weijie Xu,

Shuhong Wang,

Jianguo Zhu

Publication year - 2017

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4974983

Subject(s) - extended finite element method , finite element method , computer science , node (physics) , field (mathematics) , interface (matter) , electric field , algorithm , structural engineering , mathematics , engineering , physics , parallel computing , bubble , quantum mechanics , maximum bubble pressure method , pure mathematics

This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. The accuracy analysis of structure with nearby interfaces within XFEM is presented. A numerical example applied to the parallel plate electrodes in 1-D static electric field is provided. Two types of meshing are used to analyse the accuracy of the meshing where the support of the enriched node are cut by more than one interface

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research