Open AccessErratum: “The role of defects in the electrical properties of NbO2 thin film vertical devices” [AIP Advances 6, 125006 (2016)]
Author(s) -
Toyanath Joshi,
Pavel Borisov,
David Lederman
Publication year - 2017
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4974747
Subject(s) - materials science , thin film , optoelectronics , nanotechnology , engineering physics , physics
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