Open AccessTHz – ToF Optical Layer Analysis (OLA) to determine optical properties of dielectric materials
Author(s) -
Holger Spranger,
Jörg Beckmann
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4974707
Subject(s) - terahertz radiation , dielectric , classification of discontinuities , materials science , optics , optoelectronics , diffraction , layer (electronics) , aperture (computer memory) , ceramic , physics , acoustics , composite material , mathematical analysis , mathematics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom