Open AccessObject’s optical geometry measurements based on Extended Depth of Field (EDoF) approach
Author(s) -
Michał Szydłowski,
B. Powałka,
Tomasz Chady,
Paweł Waszczuk
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4974704
Subject(s) - profilometer , wavelet transform , computer vision , software , computer science , wavelet , optics , artificial intelligence , engineering , physics , mechanical engineering , programming language , surface finish
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