Publisher’s Note: “Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm” [Rev. Sci. Instrum. 87, 123106 (2016)] | Zendy

Thanh-Hung Dinh | Zendy; Yoshiki Kondo | Zendy; Toshiki Tamura | Zendy; Yuichi Ono | Zendy; Hiroyuki Hara | Zendy; Hiroki Oikawa | Zendy; Yoichi Yamamoto | Zendy; Masahiko Ishino | Zendy; Masaharu Nishikino | Zendy; Tetsuya Makimura | Zendy; Padraig Dunne | Zendy; G. O’Sullivan | Zendy; Shigeru Ohta | Zendy; Ken Kitano | Zendy; Takeo Ejima | Zendy; Tadashi Hatano | Zendy; Takeshi Higashiguchi | Zendy

Open Access

Publisher’s Note: “Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm” [Rev. Sci. Instrum. 87, 123106 (2016)]

Author(s) -

Thanh-Hung Dinh,

Yoshiki Kondo,

Toshiki Tamura,

Yuichi Ono,

Hiroyuki Hara,

Hiroki Oikawa,

Yoichi Yamamoto,

Masahiko Ishino,

Masaharu Nishikino,

Tetsuya Makimura,

Padraig Dunne,

G. O’Sullivan,

Shigeru Ohta,

Ken Kitano,

Takeo Ejima,

Tadashi Hatano,

Takeshi Higashiguchi

Publication year - 2017

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4973926

Subject(s) - spectrometer , ion , plasma , atomic physics , plasma diagnostics , physics , soft x rays , x ray , optics , highly charged ion , materials science , nuclear physics , ion source , laser , quantum mechanics

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