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Electron and lattice dynamics of transition metal thin films observed by ultrafast electron diffraction and transient optical measurements
Author(s) -
A. Nakamura,
T. Shimojima,
Masaki Nakano,
Yoshihiro Iwasa,
K. Ishizaka
Publication year - 2016
Publication title -
structural dynamics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.415
H-Index - 29
ISSN - 2329-7778
DOI - 10.1063/1.4971210
Subject(s) - ultrafast electron diffraction , photoexcitation , thin film , materials science , electron diffraction , diffraction , lattice constant , thermalisation , electron , condensed matter physics , ultrashort pulse , phonon , transmittance , crystallite , reflection high energy electron diffraction , optics , atomic physics , laser , optoelectronics , physics , nanotechnology , excited state , quantum mechanics , metallurgy
We report the ultrafast dynamics of electrons and lattice in transition metal thin films (Au, Cu, and Mo) investigated by a combination of ultrafast electron diffraction (UED) and pump-probe optical methods. For a single-crystalline Au thin film, we observe the suppression of the diffraction intensity occuring in 10 ps, which direcly reflects the lattice thermalization via the electron-phonon interaction. By using the two-temperature model, the electron-phonon coupling constant ( g ) and the electron and lattice temperatures ( T e , T l ) are evaluated from UED, with which we simulate the transient optical transmittance. The simulation well agrees with the experimentally obtained transmittance data, except for the slight deviations at the initial photoexcitation and the relaxed quasi-equilibrium state. We also present the results similarly obtained for polycrystalline Au, Cu, and Mo thin films and demonstrate the electron and lattice dynamics occurring in metals with different electron-phonon coupling strengths.

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