Combined scanning probe microscopy and x-ray scattering instrument for in situ catalysis investigations | Zendy

Willem G. Onderwaater | Zendy; P. C. van der Tuijn | Zendy; Rik V. Mom | Zendy; M. A. Van Spronsen | Zendy; S. B. Roobol | Zendy; Mehdi Saedi | Zendy; Jakub Drnec | Zendy; H. Isérn | Zendy; Francesco Carlà | Zendy; T. Dufrane | Zendy; Raymond Koehler | Zendy; Bert Crama | Zendy; Irene M. N. Groot | Zendy; Roberto Felici | Zendy; J.W.M. Frenken | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Combined scanning probe microscopy and x-ray scattering instrument for in situ catalysis investigations

Author(s) -

Willem G. Onderwaater,

P. C. van der Tuijn,

Rik V. Mom,

M. A. Van Spronsen,

S. B. Roobol,

Mehdi Saedi,

Jakub Drnec,

H. Isérn,

Francesco Carlà,

T. Dufrane,

Raymond Koehler,

Bert Crama,

Irene M. N. Groot,

Roberto Felici,

J.W.M. Frenken

Publication year - 2016

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4968804

Subject(s) - diffractometer , scattering , synchrotron , materials science , microscope , scanning probe microscopy , synchrotron radiation , optics , microscopy , scanning electron microscope , nanotechnology , physics

We have developed a new instrument combining a scanning probe microscope (SPM) and an X-ray scattering platform for ambient-pressure catalysis studies. The two instruments are integrated with a flow reactor and an ultra-high vacuum system that can be mounted easily on the diffractometer at a synchrotron end station. This makes it possible to perform SPM and X-ray scattering experiments in the same instrument under identical conditions that are relevant for catalysis.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research