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Analytical formulas are derived describing the coherent absorption of light from a realistic multilayer structure composed by an optically conducting surface on a sup- porting substrate. The model predicts two fundamental results. First, the absorption regime named coherent perfect transparency theoretically can always be reached. Second, the optical conductance of the surface can be extrapolated from absorption experimental data even when the substrate thickness is unknown. The theoretical predictions are experimentally verified by analyzing a multilayer graphene structure grown on a silicon carbide substrate. The graphene thickness estimated through the coherent absorption technique resulted in good agreement with the values obtained by two other spectroscopic techniques. Thanks to the high spatial resolution that can be reached and high sensitivity to the probed structure thickness, coherent absorp- tion spectroscopy represents an accurate and non-destructive diagnostic method for the spatial mapping of the optical properties of two-dimensional materials and of metasurfaces on a wafer scale

Coherent absorption of light by graphene and other optically conducting surfaces in realistic on-substrate configurations