Room temperature gas-solid reaction of titanium on glass surfaces forming a very low resistivity layer
Author(s) -
Hugo Solís-Sánchez,
Neville Clark,
Daniel E. Azofeifa,
E. Avendaño
Publication year - 2016
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4963679
Subject(s) - quartz , polyamide , materials science , electrical resistivity and conductivity , titanium , layer (electronics) , electrical resistance and conductance , composite material , sheet resistance , fused quartz , condensation , metallurgy , physics , electrical engineering , thermodynamics , engineering
Titanium films were deposited on quartz, glass, polyamide and PET substrates in a high vacuum system at room temperature and their electrical resistance monitored in vacuo as a function of thickness. These measurements indicate that a low electrical resistance layer is formed in a gas-solid reaction during the condensation of the initial layers of Ti on glass and quartz substrates. Layers begin to show relative low electrical resistance at around 21 nm for glass and 9nm for quartz. Samples deposited on polyamide and PET do not show this low resistance feature
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