Analysis method for Thomson scattering diagnostics in GAMMA 10/PDX | Zendy

Koichi Ohta | Zendy; Masayuki Yoshikawa | Zendy; Ryo Yasuhara | Zendy; M. Chikatsu | Zendy; Y. Shima | Zendy; J. Kohagura | Zendy; M. Sakamoto | Zendy; Y. Nakasima | Zendy; T. Imai | Zendy; M. Ichimura | Zendy; I. Yamada | Zendy; H. Funaba | Zendy; T. Minami | Zendy

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Analysis method for Thomson scattering diagnostics in GAMMA 10/PDX

Author(s) -

Koichi Ohta,

Masayuki Yoshikawa,

Ryo Yasuhara,

M. Chikatsu,

Y. Shima,

J. Kohagura,

M. Sakamoto,

Y. Nakasima,

T. Imai,

M. Ichimura,

I. Yamada,

H. Funaba,

T. Minami

Publication year - 2016

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4963161

Subject(s) - thomson scattering , scattering , signal (programming language) , computational physics , signal processing , optics , physics , computer science , materials science , digital signal processing , programming language , computer hardware

We have developed an analysis method to improve the accuracies of electron temperature measurement by employing a fitting technique for the raw Thomson scattering (TS) signals. Least square fitting of the raw TS signals enabled reduction of the error in the electron temperature measurement. We applied the analysis method to a multi-pass (MP) TS system. Because the interval between the MPTS signals is very short, it is difficult to separately analyze each Thomson scattering signal intensity by using the raw signals. We used the fitting method to obtain the original TS scattering signals from the measured raw MPTS signals to obtain the electron temperatures in each pass

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