Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor | Zendy

Robert E. Peale | Zendy; Evan M. Smith | Zendy; Christian W. Smith | Zendy; Farnood Khalilzadeh-Rezaie | Zendy; Masa Ishigami | Zendy; Nima Nader | Zendy; Shiva Vangala | Zendy; Justin W. Cleary | Zendy

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Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor

Author(s) -

Robert E. Peale,

Evan M. Smith,

Christian W. Smith,

Farnood Khalilzadeh-Rezaie,

Masa Ishigami,

Nima Nader,

Shiva Vangala,

Justin W. Cleary

Publication year - 2016

Publication title -

apl photonics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 2.094

H-Index - 34

ISSN - 2378-0967

DOI - 10.1063/1.4962428

Subject(s) - materials science , surface plasmon polariton , optoelectronics , capacitor , polariton , surface plasmon , surface plasmon resonance , excitation , excited state , silicon , optics , biasing , transmittance , prism , substrate (aquarium) , angle of incidence (optics) , plasmon , atomic physics , physics , nanotechnology , voltage , nanoparticle , oceanography , quantum mechanics , geology

An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors

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