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Edge structures and properties of triangular antidots in single-layer MoS2
Author(s) -
LiYong Gan,
Yingchun Cheng,
Udo Schwingenschlögl,
Yingbang Yao,
Yong Sheng Zhao,
Xixiang Zhang,
Wei Huang
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4962132
Subject(s) - zigzag , enhanced data rates for gsm evolution , materials science , density functional theory , condensed matter physics , scanning electron microscope , etching (microfabrication) , layer (electronics) , crystallography , atmospheric temperature range , atom (system on chip) , doping , scanning tunneling microscope , nanotechnology , optoelectronics , chemistry , computational chemistry , geometry , physics , composite material , telecommunications , mathematics , meteorology , computer science , embedded system
Density functional theory and experiments are employed to shed light on the edge structures of antidots in O etched single-layer MoS2. The equilibrium morphology is found to be the zigzag Mo edge with each Mo atom bonded to two O atoms, in a wide range of O chemical potentials. Scanning electron microscopy shows that the orientation of the created triangular antidots is opposite to the triangular shape of the single-layer MoS2 samples, in agreement with the theoretical predictions. Furthermore, edges induced by O etching turn out to be p-doped, suggesting an effective strategy to realize p-type MoS2 devices. Published by AIP Publishing

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