Open AccessCross-section imaging and p-type doping assessment of ZnO/ZnO:Sb core-shell nanowires by scanning capacitance microscopy and scanning spreading resistance microscopy
Author(s) -
Lin Wang,
V. Sallet,
Corinne Sartel,
G. Brémond
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4962046
Subject(s) - scanning electron microscope , materials science , doping , spreading resistance profiling , nanowire , antimony , chemical vapor deposition , optoelectronics , semiconductor , nanomaterials , microscopy , capacitance , nanotechnology , analytical chemistry (journal) , optics , composite material , chemistry , electrode , metallurgy , physics , chromatography
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