Open AccessNm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challenges
Author(s) -
Evgeny Nazaretski,
Hanfei Yan,
K. Lauer,
Xiaojing Huang,
Weihe Xu,
Sebastian Kalbfleisch,
Hui Yan,
Li Li,
Nathalie Bouet,
Juan Zhou,
Deming Shu,
R. Conley,
Yong S. Chu
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4961143
Subject(s) - beamline , optics , image resolution , ptychography , materials science , resolution (logic) , microscopy , microscope , diffraction , physics , computer science , beam (structure) , artificial intelligence
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