Origin of a Raman scattering peak generated in single-walled carbon nanotubes by X-ray irradiation and subsequent thermal annealing

We have found that a Raman scattering (RS) peak around 1870 cm−1 was produced by the annealing of the X-ray irradiated film of single-walled carbon nanotubes (SWNTs) at 450 oC. The intensity of 1870-cm−1 peak showed a maximum at the probe energy of 2.3 eV for the RS spectroscopy with various probe lasers. Both the peak position and the probe-energy dependence were almost identical to those of the one-dimensional carbon chains previously reported in multi-walled carbon nanotubes. Consequently, we concluded that the 1870-cm−1 peak found in the present study is attributed to carbon chains. The formation of carbon chains by the annealing at temperature lower than 500 oC is firstly reported by the present study. The carbon chains would be formed by aggregation of the interstitial carbons, which are formed as a counterpart of carbon vacancies by X-ray irradiation diffused on SWNT walls. The result indicates that the combination of X-ray irradiation and subsequent thermal annealing is a feasible tool for generating new nanostructures in SWNT