Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy | Zendy

Stéphanie FernandezPeña | Zendy; Céline Lichtensteiger | Zendy; Pavlo Zubko | Zendy; Christian Weymann | Zendy; Stefano Gariglio | Zendy; JeanMarc Triscone | Zendy

Open Access

Ferroelectric domains in epitaxial Pb_xSr_1−xTiO₃ thin films investigated using X-ray diffraction and piezoresponse force microscopy

Author(s) -

Stéphanie FernandezPeña,

Céline Lichtensteiger,

Pavlo Zubko,

Christian Weymann,

Stefano Gariglio,

JeanMarc Triscone

Publication year - 2016

Publication title -

apl materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.571

H-Index - 60

ISSN - 2166-532X

DOI - 10.1063/1.4960621

Subject(s) - piezoresponse force microscopy , materials science , ferroelectricity , thin film , x ray crystallography , diffraction , sputter deposition , epitaxy , sputtering , condensed matter physics , crystallography , analytical chemistry (journal) , mineralogy , optoelectronics , optics , dielectric , nanotechnology , physics , chemistry , layer (electronics) , chromatography

We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed

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