Open AccessImproving positive and negative bias illumination stress stability in parylene passivated IGZO transistors
Author(s) -
Asal Kiazadeh,
Henrique L. Gomes,
Pedro Barquinha,
Jorge Martins,
Ana Rovisco,
Joana V. Pinto,
Rodrigo Martins,
Elvira Fortunato
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4960200
Subject(s) - passivation , materials science , threshold voltage , thin film transistor , optoelectronics , transistor , parylene , coating , instability , semiconductor , layer (electronics) , voltage , composite material , polymer , electrical engineering , physics , mechanics , engineering
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