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Combined electrical and resonant optical excitation characterization of multi-quantum well InGaN-based light-emitting diodes
Author(s) -
Silvino Presa,
Pleun Maaskant,
Menno J. Kappers,
C. J. Humphreys,
Brian Corbett
Publication year - 2016
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4959100
Subject(s) - optoelectronics , materials science , light emitting diode , photoluminescence , diode , photovoltaic system , biasing , quantum efficiency , quantum well , light emission , voltage , optics , laser , physics , electrical engineering , quantum mechanics , engineering
We present a comprehensive study of the emission spectra and electrical characteristics of InGaN/GaN multi-quantum well light-emitting diode (LED) structures under resonant optical pumping and varying electrical bias. A 5 quantum well LED with a thin well (1.5 nm) and a relatively thick barrier (6.6 nm) shows strong bias-dependent properties in the emission spectra, poor photovoltaic carrier escape under forward bias and an increase in effective resistance when compared with a 10 quantum well LED with a thin (4 nm) barrier. These properties are due to a strong piezoelectric field in the well and associated reduced field in the thicker barrier. We compare the voltage ideality factors for the LEDs under electrical injection, light emission with current, photovoltaic mode (PV) and photoluminescence (PL) emission. The PV and PL methods provide similar values for the ideality which are lower than for the resistance-limited electrical method. Under optical pumping the presence of an n-type InGaN underlayer in a...

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