Open AccessCalculation of dielectric constant of buffer layer graphene on SiC measured by spectroscopy ellipsometry using Gauss-Newton numerical inversion method
Author(s) -
Kiki Megasari,
Eri Widianto,
Vita Efelina,
Kamsul Abraha,
Andrew T. S. Wee,
Andrivo Rusydi,
Iman Santoso
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4958587
Subject(s) - graphene , dielectric , ellipsometry , materials science , permittivity , gauss , inversion (geology) , analytical chemistry (journal) , computational physics , optoelectronics , thin film , physics , chemistry , nanotechnology , quantum mechanics , chromatography , paleontology , structural basin , biology
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