Drude Lorentz model for dielectric constant of multilayer epitaxial graphene on C-face SiC measured by synchrotron radiation
Author(s) -
Vita Efelina,
Eri Widianto,
Kiki Megasari,
Kuwat Triyana,
Ahmad Kusumaatmaja,
Andrivo Rusydi,
Iman Santoso
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4958581
Subject(s) - dielectric , materials science , epitaxy , wavenumber , synchrotron radiation , condensed matter physics , drude model , substrate (aquarium) , optics , lorentz transformation , graphene , layer (electronics) , physics , optoelectronics , nanotechnology , quantum mechanics , oceanography , geology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom