Erratum: “Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material” [J. Appl. Phys. 119, 035101 (2016)] | Zendy

R. Jaramillo | Zendy; MengJu Sher | Zendy; Benjamin K. Ofori-Okai | Zendy; Vera Steinmann | Zendy; Chuanxi Yang | Zendy; Katy Hartman | Zendy; Keith A. Nelson | Zendy; Aaron M. Lindenberg | Zendy; Roy G. Gordon | Zendy; Tonio Buonassisi | Zendy

Open Access

Erratum: “Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material” [J. Appl. Phys. 119, 035101 (2016)]

Author(s) -

R. Jaramillo,

MengJu Sher,

Benjamin K. Ofori-Okai,

Vera Steinmann,

Chuanxi Yang,

Katy Hartman,

Keith A. Nelson,

Aaron M. Lindenberg,

Roy G. Gordon,

Tonio Buonassisi

Publication year - 2016

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.4954931

Subject(s) - photoconductivity , metrology , terahertz radiation , optoelectronics , materials science , transient (computer programming) , tin , photovoltaic system , thin film , photovoltaic effect , sulfide , optics , physics , nanotechnology , electrical engineering , engineering , computer science , metallurgy , operating system

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