Open AccessDetection and characterization of singly deuterated silylene, SiHD, via optical spectroscopy
Author(s) -
Damian L. Kokkin,
Tongmei Ma,
Timothy C. Steimle,
Trevor J. Sears
Publication year - 2016
Publication title -
the journal of chemical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.071
H-Index - 357
eISSN - 1089-7690
pISSN - 0021-9606
DOI - 10.1063/1.4954702
Subject(s) - spectroscopy , silylene , deuterium , fluorescence , chemistry , perpendicular , molecular physics , analytical chemistry (journal) , materials science , atomic physics , optics , silicon , physics , optoelectronics , geometry , mathematics , quantum mechanics , chromatography
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