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Scanning three-dimensional x-ray diffraction microscopy using a high-energy microbeam
Author(s) -
Yujiro Hayashi,
Yoshiharu Hirose,
Yoshiki Seno
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4952944
Subject(s) - microbeam , beamline , materials science , spring 8 , optics , diffraction , scanning electron microscope , microscopy , x ray crystallography , beam (structure) , physics , composite material

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