Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source | Zendy

Stanislav Stoupin | Zendy; Yuri Shvyd’ko | Zendy; E. Trakhtenberg | Zendy; Zunping Liu | Zendy; Keenan Lang | Zendy; Xianrong Huang | Zendy; Michael Wieczorek | Zendy; Elina Kasman | Zendy; John Hammonds | Zendy; Albert T. Macrander | Zendy; Lahsen Assoufid | Zendy

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Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

Author(s) -

Stanislav Stoupin,

Yuri Shvyd’ko,

E. Trakhtenberg,

Zunping Liu,

Keenan Lang,

Xianrong Huang,

Michael Wieczorek,

Elina Kasman,

John Hammonds,

Albert T. Macrander,

Lahsen Assoufid

Publication year - 2016

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.4952940

Subject(s) - beamline , advanced photon source , optics , x ray optics , collimator , diffraction , x ray , angular resolution (graph drawing) , physics , photon , diffraction topography , beam (structure) , characterization (materials science) , image resolution , crystal (programming language) , materials science , photon counting , x ray crystallography , computer science , mathematics , combinatorics , programming language

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