Open AccessRietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method
Author(s) -
Masahiko Tanaka,
Yoshio Katsuya,
Osami Sakata
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4952939
Subject(s) - diffraction , powder diffraction , materials science , synchrotron , scattering , optics , rietveld refinement , x ray crystallography , absorption (acoustics) , anomalous scattering , beam (structure) , physics , nuclear magnetic resonance
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