High-speed imaging at high x-ray energy: CdTe sensors coupled to charge-integrating pixel array detectors
Author(s) -
Julian Becker,
Mark W. Täte,
Katherine S. Shanks,
Hugh T. Philipp,
Joel T. Weiss,
Prafull Purohit,
Darol Chamberlain,
Sol M. Grüner
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4952909
Subject(s) - pixel , detector , photon counting , chip , physics , dot pitch , x ray detector , frame rate , charge sharing , image sensor , framing (construction) , optics , optoelectronics , charge coupled device , electrical engineering , engineering , structural engineering
Pixel Array Detectors (PADs) consist of an x-ray sensor layer bonded pixel-by-pixel to an underlying readout chip. This approach allows both the sensor and the custom pixel electronics to be tailored independently to best match the x-ray imaging requirements. Here we describe the hybridization of CdTe sensors to two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory. The charge-integrating architecture of each of these PADs extends the instantaneous counting rate by many orders of magnitude beyond that obtainable with photon counting architectures. The Keck PAD chip consists of rapid, 8-frame, in-pixel storage elements with framing periods <150 ns. The second detector, the MM-PAD, has an extended dynamic range by utilizing an in-pixel overflow counter coupled with charge removal circuitry activated at each overflow. This allows the recording of signals from the single-photon level to tens of millions of x-rays/pixel/frame w...
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