Open AccessSmall angle deflectometer with submillimeter lateral resolution for flatness measurements of optics
Author(s) -
Gerd Ehret,
Michael Schulz,
S. Quabis
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4952891
Subject(s) - optics , flatness (cosmology) , resolution (logic) , physics , image resolution , crosstalk , materials science , computer science , cosmology , quantum mechanics , artificial intelligence
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