Erratum: “Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors” [Appl. Phys. Lett. 106, 103109 (2015)] | Zendy

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Erratum: “Charge trapping at the MoS₂-SiO₂ interface and its effects on the characteristics of MoS₂ metal-oxide-semiconductor field effect transistors” [Appl. Phys. Lett. 106, 103109 (2015)]

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