Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers | Zendy

Daniel Badali | Zendy; Régis Y. N. Gengler | Zendy; R. J. Dwayne Miller | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers

Author(s) -

Daniel Badali,

Régis Y. N. Gengler,

R. J. Dwayne Miller

Publication year - 2016

Publication title -

structural dynamics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.415

H-Index - 29

ISSN - 2329-7778

DOI - 10.1063/1.4949538

Subject(s) - diffraction , electron diffraction , picosecond , monolayer , ultrafast electron diffraction , materials science , ultrashort pulse , thin film , reflection high energy electron diffraction , resolution (logic) , electron , optics , optoelectronics , nanotechnology , physics , computer science , laser , artificial intelligence , quantum mechanics

A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research