Open AccessNano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad
Author(s) -
Simon G. Alcock,
Ioaistea,
Kawal Sawhney
Publication year - 2016
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4949272
Subject(s) - monochromator , metrology , optics , x ray optics , diamond , grating , nanometrology , synchrotron , physics , diamond turning , synchrotron radiation , materials science , x ray , wavelength , composite material
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom